Advanced Characterization Techniques for Optical, Semiconductor, and Data Storage Components (Proceedings of SPIE Vol 4779)
By: Angela Duparre (author), Bhanwar Singh (author)Paperback
1 - 2 weeks availability
This new edition takes into account advances in software and technology such as interactive whiteboards and digital cameras, focusing upon how these new resources can be most effectively used to enhance teaching and learning in the classroom.
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- ID: 9780819445469
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