Advanced Characterization Techniques For Optical Semiconductor and Data Storage Components
By: Angela Duparre (author), Bhanwar Singh (author)Paperback
Up to 2 WeeksUsually despatched within 2 weeks
This new edition takes into account advances in software and technology such as interactive whiteboards and digital cameras, focusing upon how these new resources can be most effectively used to enhance teaching and learning in the classroom.
Number Of Pages:
- ID: 9780819445469
- Saver Delivery: Yes
- 1st Class Delivery: Yes
- Courier Delivery: Yes
- Store Delivery: Yes
Prices are for internet purchases only. Prices and availability in WHSmith Stores may vary significantly
© Copyright 2013 - 2018 WHSmith and its suppliers.
WHSmith High Street Limited Greenbridge Road, Swindon, Wiltshire, United Kingdom, SN3 3LD, VAT GB238 5548 36