Advanced Characterization Techniques For Optical Semiconductor and Data Storage Components

Advanced Characterization Techniques For Optical Semiconductor and Data Storage Components

By: Angela Duparre (author), Bhanwar Singh (author)Paperback

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Description

This new edition takes into account advances in software and technology such as interactive whiteboards and digital cameras, focusing upon how these new resources can be most effectively used to enhance teaching and learning in the classroom.

Product Details

  • ISBN13: 9780819445469
  • Format: Paperback
  • Number Of Pages: 192
  • ID: 9780819445469
  • ISBN10: 0819445460

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  • Saver Delivery: Yes
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