Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies III (Proceedings of SPIE v. 6672)

Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies III (Proceedings of SPIE v. 6672)

By: Angela Duparre (author), Bhanwar Singh (author), Zu-Han Gu (author)Paperback

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Product Details

  • publication date: 10/09/2007
  • ISBN13: 9780819468208
  • Format: Paperback
  • Number Of Pages: 250
  • ID: 9780819468208
  • ISBN10: 0819468207

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