Advances in Imaging and Electron Physics: Silicon-Based Millimetre-Wave Technology (Advances in Imaging and Electron Physics 174)

Advances in Imaging and Electron Physics: Silicon-Based Millimetre-Wave Technology (Advances in Imaging and Electron Physics 174)

By: Jamal Deen (volume_editor)Hardback

More than 4 weeks availability

Description

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. * Contributions from leading authorities* Informs and updates on all the latest developments in the field

Create a review

Product Details

  • publication date: 31/12/2012
  • ISBN13: 9780123942982
  • Format: Hardback
  • Number Of Pages: 484
  • ID: 9780123942982
  • ISBN10: 0123942985

Delivery Information

  • Saver Delivery: Yes
  • 1st Class Delivery: Yes
  • Courier Delivery: Yes
  • Store Delivery: Yes

Prices are for internet purchases only. Prices and availability in WHSmith Stores may vary significantly

Close