Applied Crystallography: Proceedings of the International Conference

Applied Crystallography: Proceedings of the International Conference

By: Henryk Morawiec (volume_editor), Danuta Stroz (volume_editor)Hardback

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This volume covers the following areas: phase characterization using diffraction methods; correction factors in powder diffraction; Rietveld method application; substructure analysis in textured materials; texture inhomogeneity and its determination; new X-ray diffraction methods; small angle scattering studies in crystalline and amorphous solids; X-ray stress analysis; phase transitions and the particularly crystallography and pecularities of the reversible martensitic transformation; structure on non-crystalline materials and their crystallisation; structure and properties of new materials.

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Crystallography and stability of martensitic phases in Cu-Zn-Al shape memory alloys, M. Ahlers; powder diffraction and epitaxy, J. Fiala; phase transitions in (NH4)3H(SeO4)2, K. Lukaszewicz; modern powder diffraction applied to the study of thermal behaviour of solids - example of cerium (IV) nitrades, D. Louer; a new multilayer optic for parallel-beam applications, H. Goebel; phase characterization using the full diffraction trace, D. Smith; integrated substructure analysis in textured metallic materials; investigation of strongly distorted crystal structures by means of neutron diffraction, P. Klimanek; small-angle X-ray scattering studies of disordered solids, P.W. Schmidt; peculiarities of Martensite transformations and parameter of the SME in Fe-base and B2 type base alloys, Yu Koval; formation of macropores and mesopores in silica sol-gel system, K. Nakanishi; extinction in hexamethylenetetramine, T. Sabine; the bainitic transformation in Cu-Zn-Mn alloys, T. Czeppe; investigation of texture inhomogeneity in near-surface-layers, J. Bonarski. (Part Contents).

Product Details

  • publication date: 05/01/1995
  • ISBN13: 9789810221539
  • Format: Hardback
  • Number Of Pages: 350
  • ID: 9789810221539
  • ISBN10: 9810221533

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