Applied Crystallography, Proceedings Of The Xix Conference

Applied Crystallography, Proceedings Of The Xix Conference

By: Danuta Stroz (editor), Henryk Morawiec (editor)Hardback

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This book aims to propagate the newest achievements of applied crystallography among crystallographers, solid state physicists and materials scientists. It presents application of structural studies to materials used in industrial practice rather than those associated with the crystal structure determination only.The proceedings have been selected for coverage in:* Materials Science Citation Index (R)* Index to Scientific & Technical Proceedings (R) (ISTP (R) / ISI Proceedings)* Index to Scientific & Technical Proceedings (ISTP CDROM version / ISI Proceedings)* CC Proceedings - Engineering & Physical Sciences


New Perspectives for Crystal Solution from Powder Data (C Giacovazzo et al.); Beyond the Ability of Rietveld Analysis: Whole-Pattern Fitting Based on the Maximum Entropy Method (F Izumi); Ultra-High-Angle Double-Crystal X-Ray Diffractometry (A Okazaki & K Munakata); Microstructure and Lattice Defect Analysis of Nanocrystalline and Highly Deformed Materials by XRD Line Profile Modelling (P Scardi); Present State of Knowledge on Quasicrystals (W Steurer); Six-Dimensional Texture Analysis with High-Energy Synchrotron Radiation (H J Bunge) and other papers

Product Details

  • ISBN13: 9789812387615
  • Format: Hardback
  • Number Of Pages: 440
  • ID: 9789812387615
  • ISBN10: 9812387617

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