Applied Crystallography: Proceedings of the XVII International Conference, Wisla, Poland, 31 August-4 September 1997

Applied Crystallography: Proceedings of the XVII International Conference, Wisla, Poland, 31 August-4 September 1997

By: Henryk Morawiec (volume_editor), Danuta Stroz (volume_editor)Hardback

1 - 2 weeks availability

Description

This proceedings volume contains research data on structural investigation of materials of high industrial value. Topics discussed include: phase characterization by diffraction methods; application of direct methods for solving crystal structure from powder diffraction; electron crystallography; Rietveld method applications; defects and substructure analysis in materials; new x-ray methods; small-angle scattering studies of crystyalline and amorphous solids; phase transformation studies, including crystallography of the reversible martenistic transformation; structure of non-crystalline materials; and structure and properties of new materials.

Create a review

Contents

Dynamical diffraction by imperfect crystals, A. Authier; regularities of x-ray diffuse scattering in slightly distorted crystals containing precipitates, R.I. Barabash; temperature resolved x-ray diffractometry, A. Buchal; application of synchrotron radiation for powder diffraction, R.J. Cernik; single crystal structure determination on powders by electron crystallography, S. Hovmoller; quantitative phase analysis with the Rietveld method, R.J. Hill; x-ray analysis of dislocation-induced mosaicity in single crystals, P. Klimanek; small-angle scattering and alloy decomposition, G. Kostorz; laboratory x-ray and structure determination fromm powder diffraction data, D. Louer; the application of position-sensitive CCD detectorsin single crystal x-ray data collection, K. Ukaszewicz; mechanical properties of ceramic-based nanocomposite - role of intergranular structure, K. Niihara; determination of slip system in sapphire crystal by indentation, R. Nowak; structural determinations by means of electron diffraction and HREM, J. Pons; application of direct methods to low resolution powder data, J. Rius; application of small angle x-ray and neutron scattering in studies of the structure of disordered solids on length scales of about 5 to 10.00 A, P. Schmidt; XRD theatre of structure transformations in ferroelectric, HTSC, polytypre crystals, V. Shekhtman; on the non-crystallinity of opal, D.K. Smith; x-ray reflectivity in thin film studies, G. Stergioudis; paracrystalline distortions inherent strains and crystallite size in polymers, W. Wilke; structure and phase transformation of nano-scaled particles of alloys examined by electron diffraction and HREM, T. Tadaki. (Part contents).

Product Details

  • publication date: 06/08/1998
  • ISBN13: 9789810232832
  • Format: Hardback
  • Number Of Pages: 512
  • ID: 9789810232832
  • ISBN10: 9810232837

Delivery Information

  • Saver Delivery: Yes
  • 1st Class Delivery: Yes
  • Courier Delivery: Yes
  • Store Delivery: Yes

Prices are for internet purchases only. Prices and availability in WHSmith Stores may vary significantly

Close