Applied Crystallography: Proceedings of the XVIII Conference Wisla, Poland, 4 7 September 2000
By: Henryk Morawiec (volume_editor), Danuta Stroz (volume_editor)Hardback
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This proceedings volume contains research data from structural investigation of materials of high industrial value.
Determination of Crystal Structure from Powder Diffraction by Rietveld Method; Development of Methods and Techniques in X-Ray, Electron and Neutron Diffraction; Crystallography of Phase Transformation, Martensitic Transformation in Shape Memory Alloys; Texture Studies, Defect Structure and Microstructure Characterisation; Material Structure: Metals, Ceramic, Polymers, Amorphous Materials, Nanomaterials and Thin Films.
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- ID: 9789810246136
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