Applied Scanning Probe Methods: No. 10 - Biomimetics and Industrial Applications (Nanoscience and Technology)

Applied Scanning Probe Methods: No. 10 - Biomimetics and Industrial Applications (Nanoscience and Technology)

By: Bharat Bhushan (editor), Masahiko Tomitori (editor), Harald Fuchs (editor)Hardback

2 - 4 weeks availability

Description

The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications.

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Contents

Bharat Bhushan and Robert A. Sayer: Gecko Feet: Natural Attachment Systems for Smart Adhesion-Mechanism, Modeling and Development of Bio-Inspired Materials.- Filippo Giannazzo, Patrick Fiorenza, Vito Raineri: Carrier transport in advanced semiconductor materials.- Yasuo Cho: Visualization of fixed charges stored in condensed matter and its application to memory technology.- Toshi Kasai, Haresh Siriwardane and Bharat Bhushan: Applications of SPM in Chemical Mechanical Planarization (CMP).- Ken-ichi Shinohara: Scanning probe microscope application for single molecules in a p-conjugated polymer toward the molecular devices based on polymer chemistry.- Joachim Loos and Alexander Alexeev: Scanning Probe Microscopy on Polymer Solar Cells.- Hiroyuki Sugimura: Scanning probe anodization for nanopatterning.- Mario D'Acunto, Franco Maria Montevecchi, Paolo Giusti and Gianluca Ciardelli: Tissue Engineering: Nanoscale Contacts in Cell Adhesion to Substrates.- Tatsuo Ushiki and Kazushige Kawabata: Scanning probe microscopy in biological research.- Jiping Ye: Novel nanoindentation techniques and their applications.- Yasushi Kadota: Application to nano-dispersion macromolecule material evaluation in an electrophotographic printer.- Tianming Bao, David Fong, and Sean Hand: Automated AFM as Industrial Process Metrology for Nanoelectronic Manufacturing

Product Details

  • publication date: 11/01/2008
  • ISBN13: 9783540740841
  • Format: Hardback
  • Number Of Pages: 486
  • ID: 9783540740841
  • weight: 780
  • ISBN10: 3540740848

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  • Saver Delivery: Yes
  • 1st Class Delivery: Yes
  • Courier Delivery: Yes
  • Store Delivery: Yes

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