Providing a complete introduction to the state-of-the-art in high-speed digital testing with automated test equipment (ATE), this practical resource is the first book to focus exclusively on this increasingly important topic. Featuring clear examples, this one-stop reference covers all critical aspects of the subject, from high-speed digital basics, ATE instrumentation for digital applications, and test and measurements, to production testing, support instrumentation and text fixture design. This in-depth volume also discusses advanced ATE topics, such as multiplexing of ATE pin channels and testing of high-speed bi-directional interfaces with fly-by approaches.
Jose Moreira is a senior application consultant at the Center of Expertise in Verigy's Semiconductor Test Solutions Division. He holds an M.S. in electrical and computer engineering from the Technical University of Lisbon, Portugal. Hubert Werkmann is a senior application consultant at Verigy. He earned a Ph.D. from the University of Stuttgart working on active MCM (multi-chip module) substrates that improve MCM-System testability.
Introduction. High-Speed Digital Basics. High-Speed Interfaces Standards. ATE Instrumentation for Digital Applications. Tests and Measurements. Production Testing. Support Instrumentation. Test Fixture Design. Advanced ATE Topics. Appendices.