Design Process Integration and Characterization For Microelectronics

Design Process Integration and Characterization For Microelectronics

By: Kenneth W. Tobin (editor), Alexander Starikov (editor)Paperback

Up to 2 WeeksUsually despatched within 2 weeks

Description

We do not currently have a description for this product.

Product Details

  • ISBN13: 9780819444394
  • Format: Paperback
  • Number Of Pages: 628
  • ID: 9780819444394
  • ISBN10: 0819444391

Delivery Information

  • Saver Delivery: Yes
  • 1st Class Delivery: Yes
  • Courier Delivery: Yes
  • Store Delivery: Yes

Prices are for internet purchases only. Prices and availability in WHSmith Stores may vary significantly

Close