Engineering Thin Films with Ion Beams, Nanoscale Diagnostics, and Molecular Manufacturing (Proceedings of SPIE v. 4468)

Engineering Thin Films with Ion Beams, Nanoscale Diagnostics, and Molecular Manufacturing (Proceedings of SPIE v. 4468)

By: Wiley P. Kirk (author), Emile J. Knystautas (author), Valerie Browning (author)Paperback

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Product Details

  • ISBN13: 9780819441829
  • Format: Paperback
  • Number Of Pages: 202
  • ID: 9780819441829
  • ISBN10: 0819441821

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