The book is aimed at assessing the capabilities of state-of-the-art optical techniques in elucidating the fundamental electronic and structural properties of semiconductor and metal surfaces, interfaces, thin layers, and layer structures, and assessing the usefulness of these techniques for optimization of high quality multilayer samples through feedback control during materials growth and processing. Particular emphasis is placed on the theory of non-linear optics and dynamical processes through the use of pump-probe techniques together with the search for new optical sources. Some new applications of Scanning Probe Microscopy to Material science and biological samples, dried and in vivo, with the use of different laser sources are also presented. Materials of special interest are silicon, semiconductor-metal interfaces, semiconductor and magnetic multi-layers and III-V compound semiconductors.
Spin Injection in Semiconductors; Excited State Properties Calculations: Applications to Biological Systems; Ab-Initio Study of Ethylene on Si(001); The Simulation of the RAS Response of Sulphur on Cu(110) Using Effective Medium Theory; Characterization of Optical Properties of Semiconductors with Nanotips Structure; Multilevel Data Storage at the Nanoscale Through Scanning Near Field Optical Microscopy; and Other Papers.