In-Line Characterization Techniques For... | WHSmith Books
In-Line Characterization Techniques For Performance and Yield Enhancement In Microelectronic Manufacturing Ii-

In-Line Characterization Techniques For Performance and Yield Enhancement In Microelectronic Manufacturing Ii-

By: Ajuria (author)Paperback

Up to 2 WeeksUsually despatched within 2 weeks

Description

A collection of papers on in-line characterization techniques for performance and yield enhancement in microelectronic manufacturing. They cover: electrical/field emission techniques; optical and em-wave techniques; and surface photovoltage techniques.

Product Details

  • ISBN13: 9780819429681
  • Format: Paperback
  • Number Of Pages: 254
  • ID: 9780819429681
  • ISBN10: 0819429686

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