In-Line Characterization Techniques for Performance and Yield Enhancement in Microelectronic Manufacturing II (Proceedings of SPIE Vol 3509)
By: Sergio Ajuria (editor), Tim Z. Hossain (editor)Paperback
1 - 2 weeks availability
A collection of papers on in-line characterization techniques for performance and yield enhancement in microelectronic manufacturing. They cover: electrical/field emission techniques; optical and em-wave techniques; and surface photovoltage techniques.
Number Of Pages:
- ID: 9780819429681
- Saver Delivery: Yes
- 1st Class Delivery: Yes
- Courier Delivery: Yes
- Store Delivery: Yes
Prices are for internet purchases only. Prices and availability in WHSmith Stores may vary significantly
© Copyright 2013 - 2016 WHSmith and its suppliers.
WHSmith High Street Limited Greenbridge Road, Swindon, Wiltshire, United Kingdom, SN3 3LD, VAT GB238 5548 36