In-Line Characterization, Yield Reliability, and Failure Analyses in Microelectronic Manufacturing (Proceedings of SPIE/EUROPTO Series Vol 3743)

In-Line Characterization, Yield Reliability, and Failure Analyses in Microelectronic Manufacturing (Proceedings of SPIE/EUROPTO Series Vol 3743)

By: Seshu Pabbisetty (editor), Kostas Amberiadis (editor), Katsuya Okumura (editor), Larg H. Weiland (editor), Gudrun Kissinger (editor)Hardback

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Product Details

  • publication date: 30/04/1999
  • ISBN13: 9780819432230
  • Format: Hardback
  • Number Of Pages: 344
  • ID: 9780819432230
  • ISBN10: 0819432237

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