In-line Characterization, Yield, Reliability, and Failure Analysis in Microelectronic Manufacturing II (Proceedings of SPIE v. 4406)

In-line Characterization, Yield, Reliability, and Failure Analysis in Microelectronic Manufacturing II (Proceedings of SPIE v. 4406)

By: Gudrun Kissinger (author), Larg H. Weiland (author)Paperback

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Product Details

  • publication date: 23/04/2001
  • ISBN13: 9780819441072
  • Format: Paperback
  • Number Of Pages: 252
  • ID: 9780819441072
  • ISBN10: 0819441074

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