Infrared Characterization for Microelectronics

Infrared Characterization for Microelectronics

By: W.S. Lau (author)Hardback

2 - 4 weeks availability

£42.00 With FREE Saver Delivery


Most of the books on infrared characterization are for applications in chemistry and no book has been dedicated to infrared characterization for microelectronics. The focus of the book will be on practical applications useful to the production line and to the research and development of microelectronics. The background knowledge and significance of doing a particular type of infrared measurement will be discussed in detail. The principal purpose of the book is to serve as a useful handbook for practising engineers and scientists in the field of microelectronics.

Create a review


Introduction to infrared spectroscopy; the properties of infared transparent substrates; the measurement of oxygen and carbon in silicon; the calculation of epitexial layer thickness; the characterization of silicon dioxide and silicon nitride thin films; the characterization of PSG and BPSG; the characterization of amorphous silicon and related materials; miscellaneous applications of infrared spectroscopy in microelectronics.

Product Details

  • publication date: 28/04/1996
  • ISBN13: 9789810223526
  • Format: Hardback
  • Number Of Pages: 172
  • ID: 9789810223526
  • weight: 358
  • ISBN10: 9810223528

Delivery Information

  • Saver Delivery: Yes
  • 1st Class Delivery: Yes
  • Courier Delivery: Yes
  • Store Delivery: Yes

Prices are for internet purchases only. Prices and availability in WHSmith Stores may vary significantly