Input/Output Interconnect Networks for Gigascale Systems

Input/Output Interconnect Networks for Gigascale Systems

By: Muhannad S. Bakir (editor), James D. Meindl (editor)Hardback

1 - 2 weeks availability

Description

Today's microchips have nearly reached their performance limits. Various heat removal, power delivery, chip reliability, and input/output (I/O) signaling problems stand in the way of next-generation 3D gigascale, system-on-a-chip technology, and this cutting-edge guide describes the latest breakthroughs in microfluidics, high-density compliant electrical interconnects, and nanophotonics that are converging to solve them. Engineers get full details on state-of-the-art I/O interconnects and packaging, along with the latest advances and applications in power delivery design, analysis, and modeling. The book explores interconnect structures, materials, and packages for achieving high-bandwidth off-chip electrical communication. It brings readers up to speed with the latest heat removal technologies including chip-scale microchannel cooling, integrated micropumps and fluidic channels, and carbon nanotube interconnects.

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About Author

Muhanned S. Bakir is a research engineer at the Microelectronics Research Center and adjunct professor in the School of Electrical and Computer Engineering at Georgia Institute of Technology. James D. Meindl is the director of the Joseph M. Pettit Microelectronics Research Center and is the founding director of the Nanotechnology Research Center at Georgia Institute of Technology, where he is also the Joseph M. Pettit Chair Professor of Microsystems.

Contents

Die-Package Interaction and Impact on Low-k ILD.; Mechanically Compliant I/O Interconnects and Packaging.; Power Delivery Design and Analysis.; Optical Interconnects and Various Approaches for Chip-to-Chip Signaling.; CMOS Integrated Optical Devices.; 3D Integration and Wafer Stacking Technology.; Through-Wafer Interconnects.; Integrated Micropumps and Fluidic Channels.; CNT Thermal Properties & Applications for Heat Removal.; Wafer-Level Testing and Probe Substrates.; The Convergence of Semiconductor Technology and the Life Sciences.

Product Details

  • publication date: 30/11/2008
  • ISBN13: 9781596932463
  • Format: Hardback
  • Number Of Pages: 430
  • ID: 9781596932463
  • weight: 1089
  • ISBN10: 1596932465

Delivery Information

  • Saver Delivery: Yes
  • 1st Class Delivery: Yes
  • Courier Delivery: Yes
  • Store Delivery: Yes

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