Instrumentation, Metrology, and Standards for Nanomanufacturing (Proceedings of SPIE v. 6648)

Instrumentation, Metrology, and Standards for Nanomanufacturing (Proceedings of SPIE v. 6648)

By: Michael T. Postek (author), John A. Allgair (author)Paperback

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Product Details

  • publication date: 10/09/2007
  • ISBN13: 9780819467966
  • Format: Paperback
  • Number Of Pages: 190
  • ID: 9780819467966
  • ISBN10: 0819467960

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