Introduction to Scanning Transmission Electron Microscopy

Introduction to Scanning Transmission Electron Microscopy

By: Prof Gordon Lorimer (author), P. J. Goodhew (author), Anthony J. Garratt-Reed (author), Robert J. Keyse (author)Paperback

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Description

STEM is a discipline of importance to a growing number of microscopists. This book is essential reading for undergraduates, postgraduates and researchers requiring an up-to-date and comprehensive introduction to this rapidly growing, state of the art technique.

Contents

Why STEM? - STEM versus TEM; STEM Optics; The specimen; Imaging in the STEM; Diffraction in the STEM; Microanalysis in the STEM; Mapping in the STEM; Limits to STEM and advanced STEM; Glossary; Further reading; Index

Product Details

  • ISBN13: 9781859960660
  • Format: Paperback
  • Number Of Pages: 128
  • ID: 9781859960660
  • weight: 249
  • ISBN10: 1859960669

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