ISTFA 2009: International Symposium for Testing and Failure Analysis

ISTFA 2009: International Symposium for Testing and Failure Analysis

By: ASM International (editor)Paperback

1 - 2 weeks availability

Description

This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results.

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Product Details

  • publication date: 15/07/2009
  • ISBN13: 9781615030088
  • Format: Paperback
  • Number Of Pages: 372
  • ID: 9781615030088
  • ISBN10: 1615030085

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  • Saver Delivery: Yes
  • 1st Class Delivery: Yes
  • Courier Delivery: Yes
  • Store Delivery: Yes

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