Microelectronic Manufacturing Yield Reliability and Failure Analysis Iv

Microelectronic Manufacturing Yield Reliability and Failure Analysis Iv

By: Hartmann (author)Paperback

Up to 2 WeeksUsually despatched within 2 weeks

Description

A collection of papers on microelectronic manufacturing yield, reliability, and failure. It discusses advanced failure analysis, simulation, and packaging-related reliability issues, among other topics.

Product Details

  • ISBN13: 9780819429698
  • Format: Paperback
  • Number Of Pages: 248
  • ID: 9780819429698
  • ISBN10: 0819429694

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  • Saver Delivery: Yes
  • 1st Class Delivery: Yes
  • Courier Delivery: Yes
  • Store Delivery: Yes

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