Microelectronic Manufacturing Yield Reliability and Failure Analysis Iv
By: Hartmann (author) Paperback
Up to 2 Weeks Usually despatched within 2 weeks
A collection of papers on microelectronic manufacturing yield, reliability, and failure. It discusses advanced failure analysis, simulation, and packaging-related reliability issues, among other topics.
Number Of Pages:
Saver Delivery: Yes
1st Class Delivery: Yes
Courier Delivery: Yes
Store Delivery: Yes
Prices are for internet purchases only. Prices and availability in WHSmith Stores may vary significantly
© Copyright 2013 - 2019 WHSmith and its suppliers.
WHSmith High Street Limited Greenbridge Road, Swindon, Wiltshire, United Kingdom, SN3 3LD, VAT GB238 5548 36