Microwave Scattering and Emission Models for Users

Microwave Scattering and Emission Models for Users

By: Adrian K. Fung (author), Kun-Shan Chen (author)Hardback

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Today, microwave remote sensing has evolved into a valuable and economical tool for a variety of applications. It is used in a wide range of areas, from geological sensing, geographical mapping, and weather monitoring, to GPS positioning, aircraft traffic, and mapping of oil pollution over the sea surface. This unique resource provides microwave remote sensing professionals with practical scattering and emission data models that represent the interaction between electromagnetic waves and a scene on the Earth surface in the microwave region. The book helps engineers understand and apply these models to their specific work in the field. CD-ROM Included! It contains Mathematica code for all the scattering and emission models presented the book, so practitioners can easily use the models for their own applications.

About Author

Adrian K. Fung most recently served as the director of the Wave Scattering Research Center, a professor of electrical engineering, and a member of the Academy of Distinguished Scholars at the University of Texas at Arlington. He is also the author of Microwave Scattering and Emission Models and Their Applications (Artech House, 1994) and has coauthored and contributed to several other books in the field. Dr. Fung received his Ph.D. from the University of Kansas. Kun-Shan Chen is the director of the Communications Research Center and holds the distinguished chair professorship at the National Central University in Chung-Li, Taiwan. He is an associate editor of the IEEE Transactions on Geoscience and Remote Sensing and serves as the deputy editor-in-chief of the IEEE J-Star.


Introduction to Microwave Scattering and Emission Models for Users. The Small Perturbation Surface Backscattering Model. The Simplified Integral Equation Surface Backscattering Model. The IEM-B Surface Backscattering Model. Backscattering from Multi-Scale Surfaces. Bistatic Properties of the IEM-B Surface Scattering Model. The Standard Moment Method. Model for Scattering from a Low Dielectric Layer of Rayleigh Scatterers with Irregular Layer Boundaries. Emission Models for Rough Surfaces and a Rayleigh Layer with Irregular Layer Boundaries.

Product Details

  • ISBN13: 9781608070374
  • Format: Hardback
  • Number Of Pages: 315
  • ID: 9781608070374
  • weight: 726
  • ISBN10: 1608070379

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