Each volume of this series heralds profound changes in both the perception and practice of chemistry. This edition presents the state of the art of all important methods of instrumental chemical analysis, measurement and control. Contributions offer introductions together with sufficient detail to give a clear understanding of basic theory and apparatus involved and an appreciation of the value, potential and limitations of the respective techniques. The emphasis of the subjects treated is on method rather than results, thus aiding the investigator in applying the techniques successfully in the laboratory.
Surface Crystallography by Low-Energy Electron Diffraction (G. Somorjai & M. Van Hove); Analysis of Surfaces by Auger Electron Spectroscopy and Related Techniques (L. Kazmerski); The Analysis of Surfaces by X-Ray Photoelectron Spectroscopy (N. Turner); Low-Energy Ion Scattering and Rutherford Backscattering Spectroscopies (A. Miller, et al.); X-Ray Absorption Spectroscopy (Surface Extended and Near-Edge X-Ray Absorption Fine Structure) at Surfaces (D. Norman); Monolayer Assemblies (H. Kuhn & D. Mvbius); Applications of Spectroscopic Techniques to the In Situ Study of Electrochemical Interfaces (D. Scherson & E. Yeager); Surface-Enhanced Raman Scattering (E. Brandt & T. Cotton); Index.