Power Integrity: Measuring, Optimizing, and Troubleshooting Power Related Parameters in Electronics Systems
By: Steven M. Sandler (author)Hardback
1 - 2 weeks availability
A complete guide to the proper selection and use of test equipment for the measurement of modern power electronics Power Integrity provides engineers with expert insight on selecting and implementing appropriate test equipment to effectively measure increasingly higher speed electronics. The book contains field-tested information related to the interpretation of results, common measurement issues and resolutions, and application examples. You'll learn how to select the appropriate equipment and use effective techniques to reduce production problems, improve performance, and provide a figure of merit for comparing different parts and manufacturers. Teaches how to properly assess electronics from a black box perspective with a minimally invasive approach Covers measurement and troubleshooting techniques for EMI, a particular challenge in tablets and smartphones Discusses the latest devices such as Enhancement Gallium Nitride on Silicon (eGaN)
Steve Sandler has worked in the field of power electronics for more than 35 years. He is the founder and president of Picotest (www.Picotest.com), a company that designs and manufactures specialty test equipment. Mr. Sandler is also the founder and chief engineer of AEi Systems (www.AEiSystems.com), a company that provides engineering services, including worst case analysis, SPICE modeling, and failure analysis. He was a Test & Measurement World "Best in Test" Finalist in 2013 and 2014. Mr. Sandler is the author of Switchmode Power Supply Simulation with PSpice and SPICE 3 and co-author of SPICE Circuit Handbook.
Ch. 1: Introduction to High Fidelity Measurement Ch. 2: Measurement Domains Ch. 3: Equipment Interfaces and Probes Ch. 4: Measurement Equipment Ch. 5: Measuring Impedance Ch. 6: Measuring Stability Ch. 7: Measuring PSRR Ch. 8: Measuring Reverse Transfer and Crosstalk Ch. 9: Measuring Step Load Response Ch. 10: Measuring Ripple and Noise Ch. 11: Measuring Switching Edge Speed Ch. 12: Connection Diagrams Index
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- ID: 9780071830997
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