Reliability, Testing, and Characterization of MEMS/MOEMS (Proceedings of SPIE v. 4558 New ed.)

Reliability, Testing, and Characterization of MEMS/MOEMS (Proceedings of SPIE v. 4558 New ed.)

By: Rajeshuni Ramesham (author)Paperback

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Product Details

  • ISBN13: 9780819442864
  • Format: Paperback
  • Number Of Pages: 324
  • ID: 9780819442864
  • ISBN10: 0819442860
  • edition: New ed.

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