Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life (Proceedings of SPIE v. 4900 New ed.)

Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life (Proceedings of SPIE v. 4900 New ed.)

By: Sergei N. Bagayev (author), Yuri V. Chugui (author), Albert Weckenmann (author)Paperback

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Product Details

  • ISBN13: 9780819446862
  • Format: Paperback
  • Number Of Pages: 1382
  • ID: 9780819446862
  • ISBN10: 0819446866
  • edition: New ed.

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