Surface Scattering and Diffraction for Advanced Metrology (Proceedings of SPIE v. 4447 New ed.)
By: Zu-Han Gu (author), Alexei A. Maradudin (author)Paperback
Up to 2 WeeksUsually despatched within 2 weeks
We do not currently have a description for this product.
Number Of Pages:
- ID: 9780819441614
- Saver Delivery: Yes
- 1st Class Delivery: Yes
- Courier Delivery: Yes
- Store Delivery: Yes
Prices are for internet purchases only. Prices and availability in WHSmith Stores may vary significantly
© Copyright 2013 - 2018 WHSmith and its suppliers.
WHSmith High Street Limited Greenbridge Road, Swindon, Wiltshire, United Kingdom, SN3 3LD, VAT GB238 5548 36