Three-dimensional Imaging, Optical Metrology, and Inspection: No. 4 (Proceedings of SPIE v. 3520)

Three-dimensional Imaging, Optical Metrology, and Inspection: No. 4 (Proceedings of SPIE v. 3520)

By: Katherine Creath (editor), Donald J. Svetkoff (editor), James S. Harris (editor), Kevin G. Harding (volume_editor), etc. (volume_editor)Paperback

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Description

Topics in this volume include: structured light methods; rangefinding methods; and micromeasurements.

Product Details

  • ISBN13: 9780819429810
  • Format: Paperback
  • Number Of Pages: 314
  • ID: 9780819429810
  • ISBN10: 0819429813

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