Meta-Algorithmics: Patterns for Robust, Low Cost, High Quality Systems (IEEE Press)
By
Steven J. Simske (Author)
Hardback
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About the Author
Steven J. Simske, Hewlett-Packard Labs, Colorado, USA Dr Simske is currently Director of the Document Ecosystem Lab, at Hewlett-Packard Labs, Colorado, USA. He has been working in algorithms, imaging, machine learning and classification for the past 20 years. As an engineer at HP Labs, he has designed, developed and shipped products associated with a very broad array of domains-document understanding, image segmentation and understanding, speech recognition, medical signal processing and imaging, biometrics, natural language processing, surveillance, optical character recognition, security analytics and security printing. The advantages of systematic meta-algorithmic approaches to the robustness, accuracy, cost and/or other system features which is the focus of the book has been evident across these domains. Dr. Simske is an HP Fellow, IS&T Fellow and IEEE Senior Member. He has published 300 articles and book chapters; and holds 45 US Patents primarily in the areas of classification, machine learning, and large system design and development.
More Details
- Contributor: Steven J. Simske
- Imprint: Wiley-IEEE Press
- ISBN13: 9781118343364
- Number of Pages: 386
- Packaged Dimensions: 180x253x24mm
- Packaged Weight: 754
- Format: Hardback
- Publisher: John Wiley & Sons Inc
- Release Date: 2013-07-05
- Series: IEEE Press
- Binding: Hardback
- Biography: Steven J. Simske, Hewlett-Packard Labs, Colorado, USA Dr Simske is currently Director of the Document Ecosystem Lab, at Hewlett-Packard Labs, Colorado, USA. He has been working in algorithms, imaging, machine learning and classification for the past 20 years. As an engineer at HP Labs, he has designed, developed and shipped products associated with a very broad array of domains-document understanding, image segmentation and understanding, speech recognition, medical signal processing and imaging, biometrics, natural language processing, surveillance, optical character recognition, security analytics and security printing. The advantages of systematic meta-algorithmic approaches to the robustness, accuracy, cost and/or other system features which is the focus of the book has been evident across these domains. Dr. Simske is an HP Fellow, IS&T Fellow and IEEE Senior Member. He has published 300 articles and book chapters; and holds 45 US Patents primarily in the areas of classification, machine learning, and large system design and development.
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